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EMU Notes in Mineralogy - volume 16
Mineral reaction kinetics: Microstructures, textures, chemical and isotopic signatures
(W. Heinrich and R. Abart, editors)
Chapter 6. Spatially resolved materials characterization using synchrotron radiation
C. G. Schroer
The high brilliance of synchrotron radiation has allowed us to combine microscopy with X-ray analytical techniques such as X-ray fluorescence, absorption spectroscopy, and diffraction. In this way, elemental, chemical and structural information can be obtained locally and with high spatial resolution. The large penetration depth of X-rays in matter allows one to probe the inner structure of an object or a specimen inside a special sample environment, such as a chemical reactor or a pressure cell. Using tomographic techniques, the 3D information from inside a sample can be obtained in situ and without destructive sample preparation. In this chapter, we give an overview over X-ray microscopy techniques with chemical and structural contrast.
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