An Effect of Depth of Focus on Micrometric Analysis

R. B. Elliott
Department of Geology, The University, Nottingham

Summary: When using many patterns of integrating stage the depth of focus is so great that it is not possible to distinguish between the upper and lower surfaces of a thin section; this may introduce serious errors into micrometric analyses. A procedure to meet this difficulty is suggested.

Mineralogical Magazine; September 1956 v. 31; no. 234; p. 272-275; DOI: 10.1180/minmag.1956.031.234.08
© 1956, The Mineralogical Society
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