High-Resolution Silicon Kβ X-Ray Spectra and Crystal Structure

J. Purton and D. S. Urch
Department of Chemistry, Queen Mary College, Mile End Road, London E1 4NS

Abstract: High-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO44--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si- spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si- peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established.

Keywords: X-ray emission spectroscopy • silicon Kβ X-ray • silicates • electronic structure • chemical bond

Mineralogical Magazine; April 1989 v. 53; no. 370; p. 239-244; DOI: 10.1180/minmag.1989.053.370.11
© 1989, The Mineralogical Society
Mineralogical Society (www.minersoc.org)