Mineralogical Society Training Workshop in Electron Probe Microanalysis (EPMA) in the Mineral Sciences

A four-day course for postgraduates and researchers in academia and industry.

BOOK NOW for EPMA COURSES at the Natural History Museum

18–21 October 2011

Further dates to be announced shortly. Note that the cost of the course will be increased after the October course, so book now!

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Details of the Training Workshop

In response to demand for hands-on training in state-of-the-art techniques in the mineral sciences, the Mineralogical Society has launched a series of workshops that will take place at various research institutes around the UK. It is hoped that these courses will be of value to postgraduates as part of their ‘skills training’ for their degree course and for others as part of their Continuing Professional Development (CPD). Full time NERC PhD students may be able to apply for a bursary from their departments to attend this course.

Course outline and objectives

• To provide a fundamental theoretical background to EPMA, coupled with practical sessions run by staff experienced in microprobe analysis of diverse mineral samples, working on materials relevant to the interests of the course participants.
• Hands-on use of analytical scanning electron microscopes and a Cameca SX100 electron microprobe
• Use of dedicated off-line computers for image and data processing
• Lectures and practical sessions will be held in state-of-the-art meeting rooms and laboratories

Course tutors and equipment

Staff from the Electron Microscopy and Mineral Analysis (EMMA) Division of the Department of Mineralogy at the Natural History Museum give participants as much ‘hands-on’ experience as possible during the course, using two modern analytical scanning electron microscopes and an electron microprobe. Where possible, the participants' own samples are used for discussion of appropriate preparation and analysis routes.

For further details of the facilities used during this course please visit: http://www.nhm.ac.uk/research-curation/science-facilities/analytical-imaging/micro-analysis/index.html

Course fees

Postgraduate and post-doctoral researchers: £325 
Other academics: £650
Participants from industry: £1100 

All full members of the Mineralogical Society receive a £50.00 reduction on the above fees.  All students attending the course receive one year’s free student membership of the Society. Other non-member course participants are offered one year’s free Membership of the Society.  These membership offers  are subject to the normal conditions of entry to the Society.

Cancellation

Participants are accepted on the course dependent on a place being available at the time of application. The maximum number of participants is six. The course organizer reserves the right to cancel the course and refund course fees if there are insufficient numbers. Cancellations by participants will be accepted with full refund of fees up to one month before the course commences.

Course contents

• Why we analyse minerals, and the techniques now available
• History and recent developments in electron probe microanalysis
• Interactions between electrons and a specimen:
  • Production of X-rays, their emission, absorption and secondary fluorescence
• Basic design of X-ray microanalysis instruments
  • Vacuum systems
  • Electron guns, electromagnetic lenses and scanning
  • Beam current measurement and stability
• Electron detectors and imaging:
  • Secondary electron detectors and topographic imagery
  • Backscattered electron detectors and compositional contrast
  • Cathodoluminescence detectors in use on diverse materials
• X-ray detectors:
  • Energy-dispersive spectrometry (EDS) by lithium-drifted Silicon (Si(Li)) and Silicon Drift (SDD) detectors
  • Wavelength-dispersive spectrometry (WDS)
• Quantitative analysis:
  • Sample preparation for quantitative analysis
  • Standardization procedures, choice of appropriate standards
  • Recognition and determination of light elements in samples
  • Overlaps and interferences in EDS and WDS
  • Matrix corrections
  • EDS vs. WDS in different applications and as complementary techniques
  • Assessing data quality, precision, accuracy, detection limits and the correct way to present analytical data.
• Element mapping by EDS and WDS
  • Image processing, compositional classification, area analysis
• Automated stage control, image montages, ‘point-counting’, particle recognition and analysis.
• Applications and limitations of imaging and analysis in variable pressure (and environmental) scanning electron microscopes
• Applications of software packages in EPMA
  • Virtual WDS©
  • MinIdent©

How to find the Natural History Museum

As a participant in the electron probe microanalysis training course, you should use the Staff and Official Visitor entrance on Exhibition Road (see map below).

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