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EMU Notes in Mineralogy - volume 8

Nanoscopic approaches in Earth and planetary sciences (F. Brenker and G. Jordan, eds)

Chapter 4: Secondary Ion Mass Spectrometry – less conventional applications: TOF-SIMS, molecules and surfaces


Ian Lyon and Torsten Henkel

The aim of this chapter is to impart an understanding of the physical principles behind unusual SIMS applications and to do so in terms of conveying mental pictures of processes rather than dwelling upon mathematics.  Several texts are recommended for further reading: McPhail (2006),  Stephan (2001), Vickerman & Briggs (2001) and Benninghoven et al. (1987).

Go to the Mineralogical Society's online shop to buy a copy of the book from which this chapter is taken