EMU Volume 8 – Chapter 4

Chapter 4: Secondary Ion Mass Spectrometry – less conventional applications: TOF-SIMS, molecules and surfaces

Ian Lyon and Torsten Henkel


The aim of this chapter is to impart an understanding of the physical principles behind unusual SIMS applications and to do so in terms of conveying mental pictures of processes rather than dwelling upon mathematics.  Several texts are recommended for further reading: McPhail (2006),  Stephan (2001), Vickerman & Briggs (2001) and Benninghoven et al. (1987).

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