EMU Volume 16 – Chapter 6

Chapter 6. Spatially resolved materials characterization using synchrotron radiation

C. G. Schroer

The high brilliance of synchrotron radiation has allowed us to combine microscopy with X-ray analytical techniques such as X-ray fluorescence, absorption spectroscopy, and diffraction. In this way, elemental, chemical and structural information can be obtained locally and with high spatial resolution. The large penetration depth of X-rays in matter allows one to probe the inner structure of an object or a specimen inside a special sample environment, such as a chemical reactor or a pressure cell. Using tomographic techniques, the 3D information from inside a sample can be obtained in situ and without destructive sample preparation. In this chapter, we give an overview over X-ray microscopy techniques with chemical and structural contrast.

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